Thank you for coming to our booth in SEMICON Japan 2006.

At SEMICON Japan 2006, drawing on the concept of Customer Centric Solutions, Yokogawa focued on showcasing actual examples of our solutions provided through the courtesy of both Japanese and international customers. We also exhibited our cutting-edge testing solutions.

Yokogawa is committed to providing solutions for the various challenges customers are now facing both at the management level and production level. With the excellent capabilities covering from individual testers to control and management systems for the entire factory, we are confident that we can provide optimal solutions to each customer.

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Appearance of Hall 9	Appearance of lounge at center of booth
Exhibition corner of FPD Driver IC Test Solution	Exhibition corner of Semiconductor Manufacturing Site Total Solutions

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PRESENTATIONS

Back-end Booth (Hall 9, Booth No. 9C-804)

• Semiconductor Manufacturing Site Total Solutions
• SoC Test Solution
  High Speed Interface Test Solution
  Test Program Quality Confirmation Solution
  RF Wafer & RF-CMOS Test Solution
• FPD Test Solution
  High-Performance-Running Cost Test Solution
  Next Generation HDMI Driver Test Solution
  Program-Generate Test Solution
  World-First 4DUT Test Solution
• Memory Test Solution
  High Speed Probing Test Solution
  　Back-End Test Solution
• DRIVE & CONTROL SOLUTION / DD MOTOR & DRIVE SOLUTION
  Better Throughput for Direct Solution
  Open & Network Solution
  Motion & Embedded Solution
  FA-M3R Lineup / e-RT3 Lineup
• Image Sensor Test Solution
  CMOS Image Sensor Test Solution
  CCD Image Sensor Test Solution
  Image Quality Test Solution for Image Sensors
• Measuring Solution
  Measuring Solution for Efficiency of Power Source Devices
  Analysis Solution for Malfunctions in Electronic Circuits
  Signal Analysis Solution for High Speed Embedded Systems

Front-end Booth (Hall 3, Booth No. 3A-105)

• Semiconductor Manufacturing Site Total Solutions
  
• Enterprise Resource Planning Solution
  
• Manufacturing Execution System Solution
  
• Equipment Online Solution
  
• Equipment Engineering System Solution
  
• Recipe Management Solution
  
• Energy & Cost Management Solution Theme
  

Seminar

• Theme: Analyzing problems based on wafer tracking and final yield
  December 6, 2006 15:30 -16:20 Seminar Room 1 ( Hall 3 1F )
• Theme : Energy and cost management
  December 7, 2006 15:30 -16:20 Seminar Room 2 ( Hall 4 1F )

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GUIDE TO EXHIBITION HALLS