New Function (3): Simulated Input Function
The YS1700 includes a test run function for debugging purposes. Using the test run function makes debugging user programs much more efficient. The test run can be made in two modes: test mode 1 (TEST1), and a new test mode 2 (TEST2). The following introduces the new TEST2 mode.
When in TEST2 mode, the actual input terminals (analog and digital inputs) are disconnected from the Xn and DIn internal registers. Instead, you can change (simulate) the values input from the Xn and DIn registers via communications. Previously you would debug by connecting a voltage generator or contact signal to the signal terminal of a controller. By using TEST2 mode, you can now debug user programs without the need for these instruments.