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| FlexRay | CAN Bus | LIN Bus | UART | I²C, SPI Buses | | |
Easy and efficient observation of the physical layer and simultaneous protocol analysis enable you to evaluate the performance of your FlexRay communication system. Evaluation and test through long-duration (multiple-cycle) bus observation answer questions such as whether specific frames are being transferred as designed, whether there are any "glitches" in signals, or whether any data corruption is occurring. |
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Figure.1
FlexRay waveform, list, decode display example
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In addition to Frame Start, ID, Cycle Count, Data, and
other conditions, the SB5710/SB5310 serial bus analyzer
allows you to trigger on CRC, BSS, and FES errors
to capture physical layer voltage waveforms.
The protocol analysis results list and decode displays
are shown simultaneously with the waveform display
which is updated in real time on every trigger (Figure 1).
If a communication abnormality occurs, this helps you
to identify causes including whether the problem
is hardware or software related.
The analysis results list can be saved to a text file in csv format.
You can make a "Field Jump" in the zoom screen
to the top of a specific field in a specific frame
(the CRC field, for example),
or search the entire range of captured data
for the field's waveform by specifying field and frame conditions.
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FlexRay Eye-Diagram Analysis
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With the SB5710/SB5310, you can perform mask
and eye parameter tests (Figure 2) conforming
to the eye-diagram evaluation methods defined
by the Flex-Ray Physical Layer Conformance Test Specification.
From the accumulated test pulses,
you can perform the mask test
to calculate the number of abnormal pulses,
number of waveform samples in the abnormal portion,
and their ratio, and display the results.
You can also perform the same mask and eye parameter tests
on a specific bit specified in the on-screen zoom box (Figure 3).
Up to six mask patterns, including ones defined
by the FlexRay specifications, can be stored in the unit
and recalled as needed according to the type of test to be performed.
You can also edit masks after recalling them.
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Figure.2 Eye Parameter Items
Figure.3 Eye diagram analysis example
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Testing the Electrical Characteristics of the Bus Driver
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The SB5710/SB5310 comes with functions for calculating parameters
required for electrical characteristics tests of the bus driver
(timing measurements of the transmitter and receiver operation).
By simply selecting parameters for the source channel
and the circuit under test in an easy-to-understand graphical menu,
you can easily determine various delay times, rise/fall time,
absolute value of differential voltage, and other values. |
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Evaluating Fluctuations in Communication Delay and Cycle Time
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Figure.4 Exampe of
electrical characteristics parameters
of the FlexRay bus driver
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The SB5710/SB5310 measures BSS bit time intervals
from captured FlexRay communication data,
and can also calculate relevant statistics (Figure 5).
It supports time interval measurements
and statistical calculation of every BSS,
every BSS in frames of a specific ID,
and the first BSS in specified frames or cycles.
Figure.5 Example of statistical processing of BSS time interval |
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