The TA220 has the functions you need for production line adjustments and testing, including data-to-clock jitter measurement, data-to-clock jitter measurement excluding 2T marks and spaces, clock period measurement, pulse width measurement, and input signal amplitude measurement.

The TA220 can internally generate a synchronous clock from an RF signal for data-to-clock jitter measurement. The polarity of data edge can be selected from “↑”, “↓”, and “↑&↓”.

• Data-to-clock jitter measurement excluding 2T
  If you select the [E2T] measurement function, you can measure data-to-clock jitter excluding the edges adjacent to 2T marks and spaces. This function is useful for testing dual-layer discs.

This function measures the period of the internally generated PLL clock. This function is useful for checking whether the disc rotation speed is stable.

This function can be used to measure pulse width (data-to-data) jitter and average values. The window can be set to any value (0.00 to 999.99 nanoseconds), so you can even measure jitter and pulse width average values for recording lengths other than 2T, such as 3T and 8T. The store/recall function makes it easy to recall separate settings for each recording length.

With this function, the amplitude (Vp-p) of the input RF signal can be measured simultaneously with the jitter measurement. This can be used when the D-to-C high-speed calculation function is off. Measurement results are displayed numerically on the front panel LED, and also output as analog voltage (initial value: 1 V/1 Vp-p) through an output connector on the rear panel.

Product Home

Specifications

Features