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Time Interval Analyzers

TA720
Functions
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A new, Hight-Speed, Multifunction Addition to the TA SeriesMeeting the Needs of Developers in the Optical Disk Market 1Meeting the Needs of Developers in the Optical Disk Market 2
TA720 Screen Display for Various Types of AnalysisRear PanelEthernet and PC Card Interface (optional)
The TA720 has a variety of functions that are useful in optical disk jitter measurements. These functions can be combined for even greater efficiency in jitter measurements.
Hight-Speed (80 MS/s) Continuous Measurement
  Hight-Speed Continuous Measurement
The TA720 contains multiple counter circuits with 25 ps resolution. When these circuits are switched at high speed, the TA720 is capable of time measurement at up to 80 MS/s (12.5 ns period; see below). For example, the TA720 can continuously measure 1-7 modulation signals without dropping data, if the minimum 2T pulse width is 12.5 ns or greater. (Note: This does not apply during dual measurement function)
Dual Measurement Function
  Dual Mesurement Function
Example of simultaneous
measurement of pulse width
and data-clock jitter
Simultaneous Measurement of Data-Data Jitter and Data-Clock Jitter
The dual measurement function can be used to simultaneously measure an optical disk's data-data jitter and data-clock jitter. In the past, it was necessary to do these measurements separately, so there was a need for steps such as synchronization using an index signal from a spindle motor as a measurement-start control signal. With the TA720, however, these two measurements can be done simultaneously, so data-data jitter and data-clock jitter from the same measurement area are obtained at the same time.
Inter-Symbol Interference Analysis Function
  Inter-Symbol Interference Analysis Function
Example of jitter measurement
for each space length between
3T marks
This function extracts data corresponding to specified conditions, such as jitter for each space length immediately following a 3T mark, and jitter in each space length between one 3T mark and another. This data can be used to analyze the effects of the code on jitter.
The inter-symbol interference analysis function is useful for evaluating recording strategies, such as recording power control and phase control, and recording waveforms. The distribution of the extracted data and related statistics can also be displayed and compared against all of the data at the same time.
Code length settings that can be selected include arbitrary code length (nT), length shorter than a specified code length (NT>), and length longer than a specified code length (NT<). With these settings, for example, it is possible to measure jitter for each space length immediately following marks which are 6T or longer, and jitter following long recording lengths.
Examples of Pulse Width Data Extraction
Single
Combination
Between
Extract data immediately before or immediately after a specified code length.
Specify consecutive code and extract data immediately preceding or following them.
Specify codes preceding and following the data to be extracted.
Data-Clock Time Difference Jitter Analysis Based on Recording Length
Using the Dual Measurement Function and Inter-Symbol Interference Analysis Function in Combination
The inter-symbol interference analysis function can be used in combination with the dual measurement function (Pulse A & A-to-B time interval) to extract data-clock time difference data at each recording length (pulse width).
Examples of data-clock data extraction in case of EFM+ data
Data-Clock Data Immediately Following 3T
Data-Clock Data Immediately Following 4-14T
Data-Clock Data Excluding 3T Marks and Spaces

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