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Time Interval Analyzers

TA720
Functions
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A new, Hight-Speed, Multifunction Addition to the TA SeriesMeeting the Needs of Developers in the Optical Disk Market 1Meeting the Needs of Developers in the Optical Disk Market 2
TA720 Screen Display for Various Types of AnalysisRear PanelEthernet and PC Card Interface (optional)
Simultaneous Display of Pulse Width Bipolarity
  The TA720 can simultaneously display
The TA720 can simultaneously display histograms and statistics for both the positive and negative pulse widths. Numerical individual jitter values, distributions (difference between average value and ideal value for each pulse width), and the like can be checked while comparing the positive and negative histograms. In addition, it is possible to display bipolar histograms and statistics.
Multi-Window Function
  Multi-Window Function
Example of multi-window
screen Simultaneous display
of data-data and data-clock
histograms
This function allows you preset up to 14 windows for simultaneous analysis and display of histograms and statistics in those windows. During dual measurement function, data-data and data-clock histograms and statistics can be displayed at the same time. In cases where the CAV control is used and the data rate changes according to disk position, the auto-window function is useful for automatically adjusting the window setting. This function provides an Estimated T method, in which the clock period is estimated from the average data signal value; and a Measured T method, in which the clock period is measured from the CHB input signal. The clock period is measured to automatically adjust the window position.
Multi-Window Function
Example of multi-window setting screen
For Measuring just the Data Part or just the Header Part on and Optical Disk
The TA720 has the following functions for synchronization with the exterior:
  • External Arming
  • External Gate (connector shared with external arming)
  • Inhibit
The inhibit and external arming functions can be used to separate the data part from the header part during jitter measurement. In addition, a block sampling function can be used to divide the internal memory into as many as 1000 blocks (250 blocks during time stamp mode) for data acquisition. In cases where the recording area is small, such as during media material evaluations, the block sampling function can be used to accumulate samples by performing multiple block measurements with a small amount of data in each measurement (block).
Example of Combined Use of External Arming and Block Sampling Functions
Example
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·  TA720
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