Memory Test Systems
MT6121 (For Package Test Process) New!
| Parallel measurement: | ||||
| 128 devices (x 18 bit devices) 256 devices (x 9 bit devices) 512 devices (x 9 bit devices with compressed common DRV, IO mode.) |
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MT6111 (For Wafer Test Process)
| Parallel measurement: | ||||
| 128 devices (x 18 bit devices) 256 devices (x 9 bit devices) 512 devices (x 9 bit devices with compressed common DRV, IO mode.) |
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MT6121 (For Wafer Test Process)
| Parallel measurement: | ||||
| 128 devices (x 18 bit devices) 256 devices (x 9 bit devices) 512 devices (x 9 bit devices with compressed common DRV, IO mode.) |
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