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Memory Test Systems
MT6121  (For Package Test Process)
Parallel measurement:
128 devices (x 18 bit devices)
256 devices (x 9 bit devices)
512 devices (x 9 bit devices with compressed common DRV,
IO mode.)
MT6111  (For Wafer Test Process)

Parallel measurement:
128 devices (x 18 bit devices)
256 devices (x 9 bit devices)
512 devices (x 9 bit devices with compressed common DRV,
IO mode.)
MT6121  (For Wafer Test Process)
Parallel measurement:
128 devices (x 18 bit devices)
256 devices (x 9 bit devices)
512 devices (x 9 bit devices with compressed common DRV,
IO mode.)
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