VLSI Test System TS600

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	VLSI Test System TS600

Reduce the cost of testing system-on-a-chip devices

VLSI Test System TS600

System-on-a-chip devices are spreading rapidly in the multimedia consumer market. These modern devices have more functions and higher performance than their predecessors, and offer tremendous benefits. System-on-a-chip devices, however, are particularly cost-sensitive, and the cost of testing their advanced capabilities often is unacceptably high. One of the key issues in making these devices economically viable is how to curb the cost of testing. The TS600 has been popular for testing various system-on-a-chip applications, from the latest large-scale devices through to widely-used single-chip MCUs, reflecting its outstanding cost-performance and ability to drastically reduce the cost of testing.

Features & Performance

	High Cost Performance Utilizing the latest system design and stateof-the-art device technology, the cost of the TS600 system has been greatly reduced without compromising its underlying functions and performance, or its ability to meet the changing testing needs of the future.
	512 Pins, Full-fledged Per-pin Capability Timing edges, DC voltage levels/ measurement, and other settings can be made for each pin. This feature removes needless restrictions on the test condition settings, and thus radically reduces the test time. In addition, parallel testing, which is very effective for reducing the cost of testing, is easily accommodated by this architecture.
	High-speed Pin Electronics Solution (Optional) Test speed is dramatically improved by the new pin electronics solution which speeds up on-board control processors.
	SCAN, ALPG Options These options are ideal for large-scale system-on-a-chip devices, such as those having more than 10M gates or largecapacity embedded DRAM.
	Analog Options Incorporating the TS1000’s field-proven analog options, the TS600 can be used for advanced mixed-signal tests.
	Test Components The TS600 can efficiently and economically test a device-specific test component when it is installed on the tester load board.
	Powerful Conversion Tools for Reviving Your Existing Resources The extensive vector pattern instruction set of the TS600 contains most of the pattern instructions of conventional test systems. Thus, any vector pattern program can be easily converted for use with the TS600. Various conversion tools are also available for converting to and from other test program formats, so the TS600 can be easily used in tandem with other test systems.