Image Sensor Test System TS6600

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	Image Sensor Test System TS6600

Image Sensor Testing With High Throughput

Image Sensor Test System TS6600

The cost-effective TS6600 is widely used by many customers for testing both CCD and CMOS image sensors. We improved the quality of measurement technologies such as simultaneous measurement, high-speed image quality inspection, asynchronous calculation and the like, thus increasing testing throughput. Also, the TS6600 can be powerfully extended; thanks to the expanded scope of inspection and many image analysis functions, we can help you quantify your tests, which used to be difficult to achieve.

Features & Performance

	Super-low Noise Design for Highspeed Image Data Capture By minimizing system noise and its interference in image data, the TS6600 requires fewer data samplings of image data,thus slashing the test time.
	Up to 16M Pixels The TS6600 can efficiently test up to 16Mpixel image sensors.
	High-speed, High-resolution Data Capture for Analog and Digital Signals The TS6600 has powerful 12-bit/40 MHz ADC and 16-bit/40 MHz digital data capture circuitry.