 |
Per-pin Digitizer, Per-pin Comparator
Each LCD pin has its own digitizer and comparator to reduce test time and increase program flexibility. |
|
High Speed Digital Pin
375MHz clock to generate a 750MHz data rate 50mV voltage range adapts to fast, low power consumption serial interfaces. |
|
Visual User Interface AViPS™
Improved AViPS™ for more effective test
program development, debugging, and
analysis |
|
Lower Cost of Ownership
ST6730's footprint is smaller and it consumes less power than other comparable test systems, reducing production costs. |
|
4-DUTs Parallel Testing of LCD
Drivers
The ST6730 has made it possible to test 4-DUTs in parallel per test head. |
|
Low Running Costs
An area is available in the test head for an external testing device to be mounted (Type-A Head and Type-B Head).
The design of the probe card wiring layers has been simplified for shorter turn around times (TAT) and lower costs. |
|
| Target devices: |
|
TFT Source /Gate Driver,
STN Segment /Common Driver,
LCD Control Driver,
Organic EL Driver |
| Data rate: |
750MHz |
| Clock rate: |
375MHz |
| Number of pins: |
|
LCD: 2400 pin (max.)
I/O: 388 pin (max.) |
| Parallel measurement: |
|
2,3,4DUTs |
|
