Mixed-Signal VLSI Test System TS6800/6800C

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	Mixed-Signal VLSI Test System TS6800/6800C

Best for Automotive LSI/Mixed LSI Volume Productions —Optimum Cost Performance

Mixed-Signal VLSI Test System TS6800/6800C

The volume production of automative LSI, mixed LSI based digital as well as baseband cellular phones now requires more complicated and high-resolution testing, and yet the pressure to reduce the cost of testing continues to increase. The TS6800 is specifically designed to address these contradicting cost performance requirements. To deliver high throughput, we have added to the TS6000 the high performance analog test functions of the TS1000/2000 as well as synchronous both-way analog-digital measurement, and upgraded multiple-channel parallel measuring.

Features & Performance

	High Cost Performance Based on the acclaimed TS6000 VLSI test system, the TS6800 achieves a low system price.
	Max. 384 Pins (TS6800) Timing edges, DC voltage levels/ measurement, and other settings can be made for each pin.
	Application Box (TS6800) Working in conjunction with the newly developed Application Box (for wafer test process/package test process), multiplechannel simultaneous measuring completely revolutionizes the concepts of performance board building and debugging.