Category Sitemap
Home / Our Businesses / Semiconductor.. / LSI Test System /
Test Systems for System-on-a-Chip
VLSI Test System TS6000H+
TS6000H+
Target devices:

Large-scale system-on-a-chip devices (with built-in memory, MPU and AD/DA), largescale high-speed ASIC, ASSP such as DVD, high-speed MCU, MPU, High-speed I/F devices, SoC for digital TVs, RFCMOS onechip IC (RF Transceiver and the like)
VLSI Test System TS600
TS600
Target devices: MCU with ADC/DAC, System-on-a-Chip, Large-scale ASIC, ASSP such as DVD, Memory Cards, Real-time Clock, Controllers/Drivers
Mobile Communication IC Test System TS6900S
TS6900
Target devices: RF transceiver such as cellular phones, GPS, One-Seg mobile phones, mobile WiMAX, lowpower wireless and the like.
Mixed-Signal VLSI Test System TS6800/6800C
TS6800
Target devices:

Automotive, Power Supply ICs, HDD Comb, Motor Driver ICs,
Smart Power,CD/DVD Input Amplifier, Baseband Cellular Phones ICs
FPD Driver Test System ST6730
ST6730
Target devices: TFT Source /Gate Driver, STN Segment /Common Driver, LCD Control Driver,Organic EL Driver
CMOS Image Sensor Test System UE600(UltraEye™)
UE600
Target devices: CMOS image sensors
Image Sensor Test System TS6600
TS6600
Target devices: CMOS image sensors, CCD image sensors
Linear/mixed-signal LSI Test System TS1000/2000/500/300
TS1000
Target devices: TV/Radio/ Video/Telephone ICs, Industrial Equipment ICs, Power ICs
GLOBAL  
YOKOGAWA

Our Businesses
About Us
Worldwide Locations
Powered by Ultraseek
Semiconductor Related Products & Systems
LSI Test Systems
Contact Us
Global
Top of this page
Terms of Use
Privacy Guidelines