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YOKOGAWA

Yokogawa Electric Corporation

Test Systems for System-on-a-Chip

VLSI Test System TS6000H+

TS6000H+

Target devices:

Large-scale system-on-a-chip devices (with built-in memory, MPU and AD/DA), largescale high-speed ASIC, ASSP such as DVD, high-speed MCU, MPU, High-speed I/F devices, SoC for digital TVs, RFCMOS onechip IC (RF Transceiver and the like)

VLSI Test System TS600

TS600

Target devices: MCU with ADC/DAC, System-on-a-Chip, Large-scale ASIC, ASSP such as DVD, Memory Cards, Real-time Clock, Controllers/Drivers

Mobile Communication IC Test System TS6900S

TS6900

Target devices: RF transceiver such as cellular phones, GPS, One-Seg mobile phones, mobile WiMAX, lowpower wireless and the like.

Mixed-Signal VLSI Test System TS6800/6800C

TS6800

Target devices:

Automotive, Power Supply ICs, HDD Comb, Motor Driver ICs,
Smart Power,CD/DVD Input Amplifier, Baseband Cellular Phones ICs

FPD Driver Test System ST6730

ST6730

Target devices: TFT Source /Gate Driver, STN Segment /Common Driver, LCD Control Driver,Organic EL Driver

CMOS Image Sensor Test System UE600(UltraEye™)

UE600

Target devices: CMOS image sensors

Image Sensor Test System TS6600

TS6600

Target devices: CMOS image sensors, CCD image sensors

Linear/mixed-signal LSI Test System TS1000/2000/500/300

TS1000

Target devices: TV/Radio/ Video/Telephone ICs, Industrial Equipment ICs, Power ICs