Memory Test System

MT6111

Parallel Measurement of 256/512 Devices/Test Head at 140 MHz/280 Mbps

Memory Test System MT6111 (For Wafer Testing)

MT6111 (For Wafer Test Process) Photo shows one test head type.

This next-generation memory test system offers significantly improved cost performance and is suitable for testing all kinds of memory devices on 300 mm wafers.

Features & Performance

	High Cost Performance · Simultaneous Testing of Two Device Types
	(1) In a single test head configuration, parallel measurement of up to 512 memory devices is possible.
	(2) In a double test head configuration, throughput is drastically improved as the test heads operate independently and can simultaneously test two different device types.
	Wafer Testing for All Memory Device Types
	For DRAM, SRAM, PSRAM, Flash, and ASIC with memory
	Reduced Footprint
	Thanks to its newly developed multi-function test station, the MT6111 uses just 60% the floor space of previous Yokogawa testers.
	User Friendly
	The AViPS™ user interface reduces both development and evaluation time.

Maximum test frequency:
	140 MHz/280 Mbps

Parallel measurement:
	128 devices (x 18 bit devices) 256 devices (x 9 bit devices) 512 devices (x 9 bit devices with common DRV, compressed IO mode.)

Test head:

2 units or 1 unit

Products & Solutions: ST6731; ST6730; MT6532; MT6531; MT6121; MT6111; Contact Us

Corporate Information

Service & Support