Memory Test System

MT6121

Parallel Measurement of 256/512 Devices/Test Head at 280 MHz/560 Mbps

Memory Test System MT6121 (For Wafer Testing)

MT6121 (For Wafer Test Process)

This next-generation memory test system for evaluation, analysis and volume production offers significantly improved cost performance and is suitable for testing all kinds of memory devices on 300 mm wafers.

Features & Performance

	High Cost Performance · Simultaneous Testing of Two Device Types
	(1) Drastically improved throughput as each test head operates independently and can test a maximum of 512 memory devices
	(2) Capable of simultaneously testing two device types
	Wafer Testing for All Memory Device Types
	(1) For DRAM, SRAM, PSRAM, Flash, and ASIC with memory
	(2) For wafer and KGD (Known Good Die) tests
	Reduced Footprint
	Thanks to its newly developed multi-function test station, the MT6121 uses just 60% the floor space of previous Yokogawa testers.
	User Friendly
	The AViPS™ user interface reduces both development and evaluation time.

Maximum test frequency:
	280 MHz/560 Mbps

Parallel measurement:
	128 devices (x 18 bit devices) 256 devices (x 9 bit devices) 512 devices (x 9 bit devices with common DRV, compressed IO mode.)

Test head:

2 units or 1 unit

Products & Solutions: ST6731; ST6730; MT6532; MT6531; MT6121; MT6111; Contact Us

Corporate Information

Service & Support