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| Features (1) | Features (2)
DualCapture: A Powerful Tool for Durability Test Data Analysis | Features (3)
Modules | Features (4)
701280 Frequency Module (2 CH) | Features (5)
701280 Frequency Module (2 CH) | Features (5)
701275 Acceleration/Voltage Module | Features (5)
Firmware | Features (6)
Web Services | Features (7)
DC12 V Power Supply Input Option | | |
Innovative Solutions for Long-Term Recording |
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Simultaneous High-Speed and Low-Speed Recording Using DualCapture
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During durability testing, it is necessary to monitor the long-term trends of your data as well as capture the high speed transients that might occur. This presents a challenge as trend data is usually recorded at a slower sampling speed that might miss the transient phenomena. To meet this challenge, the DL750 offers the DualCapture function.
DualCapture 
Using DualCapture, you can now record your trend data with a slow sampling speed and still be able to capture the transient phenomena with a faster sampling speed. |
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- Integration of a High-Speed sampler (Oscilloscope) and Low-Speed sampler (Recorder) in a Single Unit
High-speed sampler: Trigger on abnormal high-speed phenomena
Low-speed in a sampler: Roll recording (trend recording)
- Separate Memory Management for Each sampler
Maximum memory for low-speed: 100 MW
Maximum memory for high-speed: 10 kW * 100 screens
- High-Speed Sampling Triggered Only by Abnormal Events Occurring during Long-Term Observation (Low-Speed Sampling)
Effective for separately capturing data at high speed
- Long Memory Equivalent to 1 Teraword (1012)
To acquire many hours of data at the higher sampling rate (10 MS/s) would require Teraword of memory:
(8 hr to 24 hr) × 60 min × 60 sec × 10 MS/s × 16 channels = 4.6 to 138 TW
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| The waveform shown above was captured at a sampling rate of 50 kS/s. The occurrence of noise can be confirmed in the graph, but the time resolution is too low to capture the waveform accurately. |
With DualCapture, the user sets triggers for capturing sudden phenomena. Up to 100 phenomena can be collected in a memory length of 10 kW at a maximum sampling rate of 10 MS/s. |
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DL Series Selection Guide
Find the right one for you! |
Serial Bus Analyzer Selection Guide
For I2C, CAN, and SPI analysis |
Probes for Digital Oscilloscopes
Supporting a variety of measurement |
Accessories for DL series
Accessories other than probes |
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