Simply select voltage and current channels in a dedicated setup menu to add power-specific parameters to the waveform parameters of the selected channels. See the specifications on the reverse side of this leaflet for the dedicated parameters (types) that are added. You can also calculate the Joule-integral (I²t) required for fuse characterization.

• Statistical Computation and Trend Display of Cycle-by-Cycle Switching Loss
  For example, in a active power factor correction circuit running in critical conduction mode, fluctuations in the switching frequency and switching current of the modulating signal, relative to the input voltage of the commercial power supply, can be displayed simultaneously along with the input voltage waveform.
  The figure on the left shows data from multiple cycles of voltage (Vds), current (Id) and the computed switching loss (Vds x Id) (M1 waveform). Loss can be calculated for each cycle within a specified range of the M1 waveform (the Iteg TY parameter), and the integrated value can be quickly computed. The DL9000 also lets you view cycle-by-cycle switching loss in a list or as a trend line. Variations between power on and steady operation can easily be seen.

With high speed acquisition (max. 2.5 million waveforms/sec.) and the history statistics function, you can compute statistical values and total loss of the switching loss waveforms across multiple intervals. By specifying a computation range, you can also compute the loss when switching ON and OFF, separately.

The number of history waveforms (Cnt = number of switching cycles) and their statistical computation results are displayed in the figure to the right.

The difference in the current probe and voltage probe signal propagation time (skew) can be automatically corrected. This is useful for accurate measurement and computation of switching loss. A deskew correction signal source (model 701935, sold separately) is available.

Quickly perform waveform computations of active power, impedance, and Joule-integral (I²t), and display the resulting waveforms. Simply select the desired function and source input channels from the menu to display the computed waveform.

Harmonics generated by the target device under test are compared to the harmonic values allowed in by the IEC standard, based on the applicable class of device (classes A-D). Bar graphs and lists can be displayed for comparing the harmonic limit levels and the actual measured harmonic levels. Measured harmonic levels exceeding the specified limit are highlighted for easy identification.

(The power supply analysis function option (/G4) includes the user-defined math option (/G2).)

Four user-defined waveforms can be defined (MATH1–MATH4) and used simultaneously in computations. In addition to a wealth of computation functions, twenty-six measurement parameters can be used in the equations. For example, you can normalize data using the amplitude of a measurement parameter. Up to 6.25 MWords per channel can be computed. Math waveforms can also be used in X-Y graphs, FFT displays, histogram analysis, and other functions.

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