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YOKOGAWA

Yokogawa Electric Corporation

Tunable Diode Laser Analyzers



 

Tunable Diode Laser Analyzers

The TDLS200 TruePeak Tunable Diode Laser (TDL) Analyzer is capable of measuring a number of near-infrared absorbing gases in harsh process environments. Able to make measurements under very challenging high temperature and pressure conditions as well as environments containing many corrosive, aggressive, and high particulate content materials, the TruePeak analyzer is one of the most robust process analyzers available.
Analysis in most applications can be conducted in-situ, reducing installation and maintenance costs.
In addition, the TDLS200's ability to perform rapid (6 seconds) and interference free measurements makes it one of the fastest and most accurate process analyzers on the market.

TDLS220

The TDLS220 TruePeak Tunable Diode Laser Analyzer is capable of measuring Oxygen in a variety of process applications with gas temperatures up to 120 °C and pressures up to 100 psig under difficult conditions (corrosive and aggressive service).
The TruePeak analyzer is one of the most robust oxygen analyzers available.
Measurements are rapid (5 seconds) and interference free, offering improved accuracy when compared to other oxygen analyzers.

This product is not available in Japan.

TDLS500

With the Yokogawa TDLS500 (ICOS) Analyzer, rapid, continuous measurements are possible for the first time in a process hardened analyzer. The TDLS500 is used for measuring trace levels of C2H2, H2S , NH3, CO2, CO; which are typically sub-ppm detection limits (application dependant).
Integrated Cavity Output Spectroscopy (ICOS) is a technique using optical absorption spectroscopy where the measured gas absorbs the laser light energy as a specific wavelength. The amount of light absorbed at the specific wavelength(s) is a function of gas concentration, sample pressure, sample temperature and optical path length. The concentration of the measured gas can be determined from Beer’s Law.

This product is not available in Japan.

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